This article has Open Peer Review reports available.
Comparison of two high-throughput semiconductor chip sequencing platforms in noninvasive prenatal testing for Down syndrome in early pregnancy
- Sunshin Kim†1,
- HeeJung Jung†2,
- Sung Hee Han†3,
- SeungJae Lee2,
- JeongSub Kwon2,
- Min Gyun Kim4,
- Hyungsik Chu5,
- Hongliang Chen6,
- Kyudong Han7,
- Hwanjong Kwak8,
- Sunghoon Park8,
- Hee Jae Joo8,
- Byung Chul Kim9Email author and
- Jong Bhak1, 9, 10, 11Email author
© Kim et al. 2016
Received: 30 September 2015
Accepted: 18 April 2016
Published: 30 April 2016
Open Peer Review reports
Pre-publication versions of this article and author comments to reviewers are available by contacting email@example.com.
|30 Sep 2015||Submitted||Original manuscript|
|15 Dec 2015||Reviewed||Reviewer Report - John Williams|
|13 Jan 2016||Reviewed||Reviewer Report - Tuangsit Wataganara|
|13 Feb 2016||Author responded||Author comments - Sunshin Kim|
|Resubmission - Version 2|
|13 Feb 2016||Submitted||Manuscript version 2|
|9 Mar 2016||Reviewed||Reviewer Report - John Williams|
|2 Apr 2016||Author responded||Author comments - Sunshin Kim|
|Resubmission - Version 3|
|2 Apr 2016||Submitted||Manuscript version 3|
|18 Apr 2016||Editorially accepted|
|30 Apr 2016||Article published||10.1186/s12920-016-0182-9|
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